All Volumes (2001-2008)
Volume
Volume II, 2002
Faculty Sponsor
Dr. Thomas M. Pekarek
Document Type
Article
Publication Date
2002
Abstract
High field magnetic measurements have been taken on the III-VI Diluted Magnetic Semiconductor Ga1-xMnxS at the National High Magnetic Field Laboratory. This paper discusses the calibration of magnetic measurements made using the cantilever technique. It has been discovered that efficiency of cantilevers may decline over time, signaled by the onset of an oscillatory effect in the cantilever data.
Suggested Citation
Maymi, Carl W., "Magnetic Measurements on Ga1-xMnxS in High Fields Using the Cantilever Technique" (2002). All Volumes (2001-2008). 118.
https://digitalcommons.unf.edu/ojii_volumes/118
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