Thin film substrates from the Raman spectroscopy point of view
Document Type
Article
Publication Date
1-1-2014
Abstract
We have investigated ten standard single crystal substrates of complex oxides on the account of their applicability in the Raman spectroscopy-based thin film research. In this study, we suggest a spectra normalization procedure that utilizes a comparison of the substrate's Raman spectra to those of well-established Raman reference materials. We demonstrate that MgO, LaGaO 3, (LaAlO3)0.3(Sr2AlTaO 6)0.7 (LSAT), DyScO3, YAlO3, and LaAlO3 can be of potential use for Raman-based thin film research. At the same time TiO2 (rutile), NdGaO3, SrLaAlO4, and SrTiO3 single crystals exhibit multiple phonon modes accompanied by strong Raman background that substantially hinder Raman-based thin film experiments. Copyright © 2014 John Wiley & Sons, Ltd.
Publication Title
Journal of Raman Spectroscopy
Volume
45
Issue
6
First Page
465
Last Page
469
Digital Object Identifier (DOI)
10.1002/jrs.4487
ISSN
03770486
E-ISSN
10974555
Citation Information
Gasparov, Jegorel, T., Loetgering, L., Middey, S., & Chakhalian, J. (2014). Thin film substrates from the Raman spectroscopy point of view. Journal of Raman Spectroscopy, 45(6), 465–469. https://doi.org/10.1002/jrs.4487